MFG Vision Limited

24/10/2023

Prep done for the PSECE 2023! See you tomorrow!

16/12/2019

Testing In Context Gaining Ground

Why simple pass/fail testing no longer works.

Why simple pass/fail testing no longer works.

11/12/2019

Gaps emerge in test and analytics

Comparison data is required for understanding drift and AI changes, but that’s not so simple.

Comparison data is required for understanding drift and AI changes, but that's not so simple.

10/12/2019

yieldHUB's most read articles 2019
As it’s that time of year for reflecting and looking back, we thought we’d share our most popular articles of 2019
http://bit.ly/358dhNh

04/12/2019

Innovative 5G start-up Movandi chooses yieldHUB for yield management

We're delighted to tell you about our new partnership with Movandi. They will start working with tier 1 communication companies soon and need YMS as they grow. After a tough selection process, they chose yieldHUB for their yield management needs.

Limerick, Ireland Leading Yield Management Software (YMS) provider, yieldHUB announced a new partnership with Movandi. yieldHUB’s combination of scalability and expert support makes them uniquely positioned to help companies like Movandi. Movandi is a venture-backed fabless startup, fueling the wi...

29/10/2019

Do you need support for your software?
Today, Kevin Robinson, Director of Customer Success in yieldHUB explores this topic.

Let’s look at 3 scenarios to explore the question. Using software that is single version Using software that is developed in house Using Software as a Service. These are not the only models or cases out there but will allow

30/09/2019

STDF Webinar
Would you like to learn more about STDF? Then join us for our webinar in October. There are three time slots available, you can attend whichever one is best for you. Register today.

Join us for a webinar on STDF, Standard Test Data Format, the most common tester datalog format in the semiconductor industry. The webinar will take place on October 22nd, 14:30 GMT, 18:30 GMT, and October 23rd 07:00 GMT. Register below, and you can attend whichever session suits

26/09/2019

What is the value of Part Average Testing (PAT)?
More and more, we are seeing a need for improved quality, reliability and transparency across the industry. There used to be some-tolerance for defects in the semiconductor industry. But we’re seeing a zero tolerance approach in the automotive industry and in many other industries too.

For example, if a consumer buys an expensive smartphone and it stops working sooner than expected, they are more likely to lose trust and switch brands permanently. By investing in Outlier Detection and PAT, you increase quality and reliability. Thereby maintaining your reputation and trust with your customers and their customers.

What is Part Average Testing (PAT)? With semiconductor manufacturers producing huge amounts of data, it can be hard to guarantee quality and reliability, even with internal tools. Many companies outsource Part Average Testing (PAT) to a bespoke yield management provider. Provided they meet the stand...

25/09/2019

STDF Webinar, October 22 or 23
Get an overview of cloud and tester-based STDF, tips and tricks for STDF and an example of a customer with an interesting way to extend its capability.

http://bit.ly/2lWBlkJ

24/09/2019

yieldHUB inks five year deal with Diodes

We're delighted to announce a new deal with one of our oldest customers Diodes Incorporated.

Julie Holland, Vice President, Corporate Operations of Diodes said “We are more than happy to be working with yieldHUB for the next five years. Their big data software and worldwide support has allowed us to manage our yields effectively over the years and their solutions have evolved with our needs.”

September, Ireland, August 2019 Today, yieldHUB announced that their customer Diodes Incorporated of Plano, Texas, USA, signed a multi-year agreement to continue using their service for at least the next five years. yieldHUB is a leading yield management system (YMS) provider based in Ireland, with....

18/09/2019

Join us for a webinar on STDF (Standard Test Data), the most common tester datalog format in the semiconductor industry. The webinar will take place on October 22nd, 14:30 GMT, 18:30 GMT, and October 23rd 07:00 GMT. Register below, and you can attend whichever session suits you best.

We will give you an overview of cloud and tester-based STDF, tips and tricks for STDF and an example of a customer with an interesting way to extend its capability.

Join us for a webinar on STDF, Standard Test Data Format, the most common tester datalog format in the semiconductor industry. The webinar will take place on October 22nd, 14:30 GMT, 18:30 GMT, and October 23rd 07:00 GMT. Register below, and you can attend whichever session suits

09/09/2019

Are Lots on Hold, holding you back?
Lots on Hold cause a bottleneck in subcons. In this article, we'll explain how you can make the process easier for your team and improve on-time delivery to your customers.

One of the biggest bottlenecks in any Subcon is Lots on Hold. The problem occurs many times a week on most factory floors. It’s something you’ve grown to loathe or endure. But, is there something you can do to reduce the amount of time lots spend on hold? In this article, we will