Yieldhub

Yieldhub Enterprise Yield Management Platform for Semiconductor & Integrated Photonics | Enabling Real-Time & Smart Manufacturing.

Helping manufacturers improve yield, reduce test costs, accelerate NPI and increase engineering & manufacturing efficiency. ABOUT

yieldHUB is a global Enterprise Yield Management Platform helping semiconductor and integrated photonics manufacturers improve yield, reduce test costs, accelerate New Product Introduction (NPI), and enable Real-Time & Smart Manufacturing. Our platform transforms semic

onductor test, manufacturing, quality and reliability data into trusted insights that help engineering and operations teams make faster decisions, identify root causes sooner and improve manufacturing performance. By unifying fragmented data into a single governed platform, yieldHUB increases engineering productivity, improves product quality and reliability, unlocks hidden manufacturing capacity and supports the journey from NPI through to high-volume manufacturing. Trusted by leading fabless semiconductor companies, IDMs, foundries, OSATs and integrated photonics manufacturers worldwide, yieldHUB has been helping manufacturers optimize yield and manufacturing operations for over 21 years. OUR STORY

Founded in 2005 by engineer John O'Donnell, yieldHUB was created to solve a problem every semiconductor engineer faced—spending too much time preparing data instead of solving manufacturing challenges. Today, yieldHUB is a globally trusted platform with customers and employees across Europe, North America and Asia, supporting some of the world's leading semiconductor and photonics manufacturers. OUR MISSION

This page shares the latest news, insights and innovations from yieldHUB and the wider semiconductor industry. We aim to create a community where engineers, manufacturing leaders and technology professionals can learn, share knowledge and stay informed. COMMUNITY GUIDELINES

We encourage respectful, constructive discussions and reserve the right to remove content that is offensive, abusive, misleading, discriminatory, spam, or infringes intellectual property rights. Repeated violations may result in users being blocked from the page.

Happy 61st National Day to Singapore 🇸🇬Singapore has been part of the yieldHUB story almost from the start. It was one o...
08/08/2026

Happy 61st National Day to Singapore 🇸🇬

Singapore has been part of the yieldHUB story almost from the start. It was one of the first places our real-time test floor intelligence, now yieldHUB Live, went to work, back in 2005.

Two decades on, it remains one of the world's great semiconductor nations: fabs, advanced assembly and test, and engineering talent that ranks with the best.

These photos are from our visits to the Embassy of Ireland, Singapore in February and July this year.

From all of us at yieldHUB, happy National Day to our friends across Singapore's semiconductor industry.

Majulah Singapura!

Your test floor is talking. Most people just can't hear it.Me? I listen for a living. "Test Floor Whisperer" was never o...
07/08/2026

Your test floor is talking. Most people just can't hear it.

Me? I listen for a living. "Test Floor Whisperer" was never on the business card, but here we are.

If you're running high-volume final test, here's what that silence is costing you:
- Fail bins quietly retested again and again, eating tester capacity you already paid for.
- Idle time nobody logs, dragging down OEE and throughput.
- A site issue trimming your yield for weeks before anyone connects the dots.
- Contactor wear that real-time contact-resistance monitoring would have flagged early. Instead it becomes yield loss, and measurements you can no longer trust on every other parameter.
- Stuck parts slipping through as quality and reliability risk with your customer's name on it.
- And the most expensive one: buying another tester and handler because the floor looks full, when the capacity was sitting there all along.

I was lucky enough to work with a talented group of colleagues on how we do the listening: yieldHUB Live, real-time intelligence and AI on your test floor, exposing these issues as they happen. Works across legacy testers too, so no rip and replace.

What customers hear back: higher OEE, higher first pass yield, fewer unnecessary retests, smart contactor cleaning, protection against stuck parts, and test-cell capex they never had to spend.

In plain terms: more good parts, first time, from the floor you already own.

Want to know what your floor has been trying to tell you? DM the whisperer. 🤫

Your MES says all 100 testers are running. Seven are idle right now.09:40, Wednesday, a test house in Vietnam. Three thi...
06/08/2026

Your MES says all 100 testers are running. Seven are idle right now.

09:40, Wednesday, a test house in Vietnam. Three things are true on the floor. None of them are in any report.

1. Seven of 100 testers idle. MES says running.

2. One tester shows 99% yield as the operator walks past. What she can't see: a part jammed in the handler, and hundreds of untested units sailing through as Bin 1s. Straight toward a customer.

3. A lot lands at 90% and every failing bin is queued for retest. Two of those bins almost never recover. Those hours are used up for very little return.

Nobody on that floor is doing anything wrong. They just can't see it.

If you run a test floor, you know how this goes. Think about how often these repeat on yours. Lost capacity, wasted retest hours, and escapes waiting to happen.

Same shift but with yieldHUB Live:

09:40: idle testers flagged the moment they go quiet

09:50: stuck part caught, alert straight to the operator

10:20: retest only on the bins that will recover, on the sites that maximise GPH

End of shift: utilization and OEE up, first-pass yield maximized, no test-integrity hazards.

No test program changes. No added test time. No hardware on any tester or handler.

I was lucky enough to help build this.

Want to see it on your own floor's data?

🇬🇧 We're heading to the TechWorks Semiconductors to Systems Summit ( ) in London on August 26th!Struggling with data and...
05/08/2026

🇬🇧 We're heading to the TechWorks Semiconductors to Systems Summit ( ) in London on August 26th!

Struggling with data and yield problems? Let's talk. yieldHUB helps semiconductor companies turn test data into faster yield gains and better quality.

📅 Book a meeting with VP of Operations Kevin Robinson and Director of Customer Success Michael Clarke using this link: https://lnkd.in/g-HjKkjU

👉 Follow us for event reminders and connect with our team before the day.

See you in London! 👋

05/08/2026

What exactly does yieldHUB do?

In this short clip, Jerome Auza, our VP of Engineering, explains how yieldHUB helps engineering teams spend less time wrangling data and more time solving problems that improve yield and manufacturing efficiency.

Imagine it's Wednesday morning in Singapore and a test engineer spots a bin shift on a lot that left the German fab two ...
29/07/2026

Imagine it's Wednesday morning in Singapore and a test engineer spots a bin shift on a lot that left the German fab two weeks ago.

In most companies that's a file transfer, a chain of emails, and a meeting on Friday.

Now imagine the other version:

- She looks at the data for the batch of chips that were tested and identical to the cleaned up view that her colleagues in Germany and the US are looking at

- She finds a strong correlation between a fab WAT parameter and the wafer sort bin, and shares that chart and analysis in one click

- A test development engineer in the UK already left a comment on that test months ago. It appears on every appearance of the test, for every future lot, so she reads it before she asks anyone

- The alert reached engineering, the subcon and operations at the same time. Nobody needs to be talked through what happened

- Her manager opens a Bird's Eye view across every team and subcon instead of requesting a status update

By Wednesday afternoon it's a decision, not a meeting invitation.

That second version is what I was in Singapore talking about back in early July: what changes when teams in different countries work on one set of data instead of their own copies of it.

Which version is your Wednesday?

Imagine it’s Wednesday morning in and a test engineer spots a bin shift on a lot that left the German fab two weeks ag...
29/07/2026

Imagine it’s Wednesday morning in and a test engineer spots a bin shift on a lot that left the German fab two weeks ago.

In most companies that’s a file transfer, a chain of emails, and a meeting on Friday.

Now imagine the other version:

- She opens the lot and sees the same consolidated data her colleagues in and the are looking at

- She finds a strong correlation between a fab parameter and the wafer sort bin, and shares that chart and analysis in one click

- A test development engineer in the UK already left a comment on that test months ago. It appears on every appearance of the test, for every future lot, so she reads it before she asks anyone

- The alert reached engineering, the subcon and operations at the same time. Nobody needs to be talked through what happened

- Her manager opens a Bird’s Eye view across every team and subcon instead of requesting a status update

By Wednesday afternoon it’s a decision, not a meeting invitation.

That second version is what we were in Singapore talking about back in early July: what changes when teams in different countries work on one set of data instead of their own copies of it.

Which version is your Wednesday?

A yield problem quietly cost this company wafers for months. Once they connected their data, everything changed:⚡ Releas...
28/07/2026

A yield problem quietly cost this company wafers for months.

Once they connected their data, everything changed:
⚡ Release decisions dropped from 1-2 days to minutes
🔗 Wafer probe and final test correlated in seconds
🌍 Around 100 engineers across three continents, one source of truth

The result: 1-5% more yield on their highest-running products. 📈

Scattered test data likely means the same blind spot for you.

See it on your own data 👉 https://www.yieldhub.com/contact

27/07/2026

When test data is scattered across disconnected systems, every yield decision slows down and starts with the same question: can I trust this?

In this clip, our CEO John O'Donnell explains why integrating data is fundamental to a complete, trusted view of your operations.

That's what yieldHUB delivers: data collaboration from fab to final test, so every team works from one trusted source. No silos, no reconciling, no guessing.

Stitching together data from disconnected tools? See what one connected view looks like on your data
👉 https://www.yieldhub.com/contact

Everyone obsesses over yield analytics. Almost nobody talks about the data underneath.Garbage in, garbage out. It quietl...
24/07/2026

Everyone obsesses over yield analytics. Almost nobody talks about the data underneath.

Garbage in, garbage out. It quietly wrecks yield decisions every day.

For 21 years, yieldHUB has been the fix: cleansing, validating, and consolidating semiconductor test data into insights you can actually trust.

If your team spends more time validating data than analyzing it, that's the problem we solve.

See it on your data 👉 https://www.yieldhub.com/contact

Prefer to read first? 👉 https://www.yieldhub.com/blogs/data-cleansing-for-yield-management-turning-yield-into-understanding

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