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Enabling Nanoscale Advances
Park Systems has always strived to push the limits of innovation in scan

Park Systems, formally PSIA, is an innovative leader in atomic force microscopy. We are committed to providing accurate yet easy to use AFMs. With features like True Non-Contact™ mode and automated software, we continue to achieve our goals of improving our products. Headquartered in South Korea, Park Systems also hosts offices in the United States, Germany, China, Mexico, Singapore, India and Japan.

10/04/2026

The pace of 𝗣𝗮𝗿𝗸 𝗦𝘆𝘀𝘁𝗲𝗺𝘀’ 𝗲𝘅𝗽𝗮𝗻𝘀𝗶𝗼𝗻 𝗼𝘃𝗲𝗿 𝘁𝗵𝗲 𝗽𝗮𝘀𝘁 𝗳𝗶𝘃𝗲 𝘆𝗲𝗮𝗿𝘀 has been truly remarkable:
🔶New strategic application centers opened in the United Kingdom, the East Coast of the United States, and Shanghai

🔶Recognition as the global leader in atomic force microscopy (AFM), achieving the highest global revenue share and surpassing long-time market competitors

🔶Expanded metrology market reach through strategic acquisitions of Accurion’s Imaging Spectroscopic Ellipsometry and AVI technologies, along with Lyncee Tec’s Digital Holographic Microscopy

🔶A major new milestone in April 2026 with the opening of Park Systems’ impressive new headquarters in Gwacheon, at the heart of the Seoul National Capital Area

This remarkable progress reflects Park Systems’ strong commitment to advancing R&D, deepening collaboration across the global academic and high-tech sectors, and building the future of precision metrology.

𝗔 𝗷𝗼𝘂𝗿𝗻𝗲𝘆 𝘄𝗼𝗿𝘁𝗵 𝗰𝗲𝗹𝗲𝗯𝗿𝗮𝘁𝗶𝗻𝗴, 𝗮𝗻𝗱 𝗮𝗻 𝗲𝘅𝗰𝗶𝘁𝗶𝗻𝗴 𝗳𝘂𝘁𝘂𝗿𝗲 𝗮𝗵𝗲𝗮𝗱.
👉 Watch the full video here: https://okt.to/d1VIXN

09/04/2026

𝗪𝗵𝗮𝘁 𝗶𝘀 𝗰𝘂𝗿𝗿𝗲𝗻𝘁𝗹𝘆 𝗹𝗶𝗺𝗶𝘁𝗶𝗻𝗴 𝘆𝗼𝘂𝗿 𝘄𝗼𝗿𝗸𝗳𝗹𝗼𝘄 𝗳𝗼𝗿 𝗹𝗮𝘆𝗲𝗿𝗲𝗱 𝗺𝗮𝘁𝗲𝗿𝗶𝗮𝗹𝘀 𝗱𝗲𝘃𝗶𝗰𝗲 𝗳𝗮𝗯𝗿𝗶𝗰𝗮𝘁𝗶𝗼𝗻: 𝘁𝘄𝗶𝘀𝘁 𝗮𝗻𝗴𝗹𝗲 𝗰𝗼𝗻𝘁𝗿𝗼𝗹, 𝘀𝗮𝗺𝗽𝗹𝗲 𝗰𝗹𝗲𝗮𝗻𝗹𝗶𝗻𝗲𝘀𝘀 𝗼𝗿 𝗮𝗹𝗶𝗴𝗻𝗺𝗲𝗻𝘁?
This webinar demonstrates how automated AFM can go beyond imaging, enabling deterministic sample manipulation and post-processing.

👉𝗥𝗲𝗴𝗶𝘀𝘁𝗲𝗿 𝘁𝗼𝗱𝗮𝘆: https://okt.to/v1JKPT

𝗞𝗲𝘆 𝘁𝗮𝗸𝗲𝗮𝘄𝗮𝘆𝘀:
• A live example of graphene flake cutting by anodic oxidation.
• Automatic probe exchange makes checking the results of a sample manipulation step easy.
• AFM can be used to make samples with cleaner interfaces and controlled twist-angle.

Discover how AFM adds extra dimensions to layered material heterostructure preparation!

07/04/2026

𝗛𝗼𝘄 𝗱𝗼 𝘆𝗼𝘂 𝗰𝗵𝗮𝗿𝗮𝗰𝘁𝗲𝗿𝗶𝘇𝗲 𝘁𝗵𝗲 𝘀𝘂𝗿𝗳𝗮𝗰𝗲 𝘁𝗼𝗽𝗼𝗴𝗿𝗮𝗽𝗵𝘆 𝗼𝗳 𝗱𝗲𝗹𝗶𝗰𝗮𝘁𝗲 𝘀𝘂𝘀𝗽𝗲𝗻𝗱𝗲𝗱 𝗹𝗮𝘆𝗲𝗿𝗲𝗱 𝗺𝗮𝘁𝗲𝗿𝗶𝗮𝗹𝘀?
The 𝗙𝗫𝟮𝟬𝟬 𝗔𝗙𝗠 delivers high-resolution 3D imaging that reveals suspended thin-film topography with clarity and without distortion. In this example a transition metal dichalcogenide (TMD) monolayer is suspended over a trench with a depth of ~40 nm. Being able to measure the surface topography of delicate suspended layers is especially valuable in the study of mechanical resonators and correlative workflows with transmission electron microscopy, enabling more comprehensive and correlative analysis of advanced nanomaterials.

💡𝗟𝗲𝗮𝗿𝗻 𝗺𝗼𝗿𝗲 𝗮𝗯𝗼𝘂𝘁 𝗙𝗫𝟮𝟬𝟬 𝗔𝗙𝗠 𝗳𝗼𝗿 𝗮𝗱𝘃𝗮𝗻𝗰𝗲𝗱 𝘁𝗵𝗶𝗻-𝗳𝗶𝗹𝗺 𝗮𝗻𝗮𝗹𝘆𝘀𝗶𝘀: https://okt.to/2yO8jH

06/04/2026

Say goodbye to the frustration of tweezers and damaged cantilevers—experience the outstanding capabilities of the AFM, the next-generation Atomic Force Microscope designed for advanced materials research and users of all skill levels. What makes the FX200 stand out?

𝗛𝗲𝗿𝗲’𝘀 𝘄𝗵𝗮𝘁 𝗶𝘁 𝗯𝗿𝗶𝗻𝗴𝘀 𝘁𝗼 𝘁𝗵𝗲 𝘁𝗮𝗯𝗹𝗲:
✅ Easy learning curves
✅ Automatic tip pickup— no more manual tip exchange
✅ No more dropped tips or tweezers
✅ Full remote control for your experiments

𝗖𝘂𝗿𝗶𝗼𝘂𝘀 𝗵𝗼𝘄 𝗶𝘁 𝗮𝗹𝗹 𝘄𝗼𝗿𝗸𝘀? 𝗖𝗼𝗺𝗲 𝘃𝗶𝘀𝗶𝘁 𝗼𝘂𝗿 𝘄𝗲𝗯𝘀𝗶𝘁𝗲 𝗮𝗻𝗱 𝗹𝗲𝗮𝗿𝗻 𝗺𝗼𝗿𝗲: https://okt.to/AlWBbX

03/04/2026

𝗪𝗵𝗮𝘁 𝗶𝗳 𝘆𝗼𝘂 𝗰𝗼𝘂𝗹𝗱 𝗺𝗲𝗮𝘀𝘂𝗿𝗲 𝗹𝗶𝘃𝗶𝗻𝗴 𝗰𝗲𝗹𝗹𝘀 𝗰𝗼𝗻𝘁𝗶𝗻𝘂𝗼𝘂𝘀𝗹𝘆 — 𝘄𝗶𝘁𝗵𝗼𝘂𝘁 𝗹𝗮𝗯𝗲𝗹𝘀, 𝘄𝗶𝘁𝗵𝗼𝘂𝘁 𝗱𝗮𝗺𝗮𝗴𝗲, 𝗮𝗻𝗱 𝘄𝗶𝘁𝗵𝗼𝘂𝘁 𝗺𝗶𝘀𝘀𝗶𝗻𝗴 𝗲𝗮𝗿𝗹𝘆 𝗰𝗵𝗮𝗻𝗴𝗲𝘀?
In this interview, we explore how 𝗗𝗶𝗴𝗶𝘁𝗮𝗹 𝗛𝗼𝗹𝗼𝗴𝗿𝗮𝗽𝗵𝗶𝗰 𝗠𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆 (𝗗𝗛𝗠) is enabling real-time, label-free analysis of cell morphology and mass distribution over extended periods.

Rather than replacing fluorescence microscopy, DHM complements it — bridging dynamic cellular behavior with molecular-level insights.
From neuroscience to cardiotoxicity studies, discover how this multimodal approach is helping researchers gain a more complete understanding of complex biological processes.

👉 𝗥𝗲𝗮𝗱 𝘁𝗵𝗲 𝗳𝘂𝗹𝗹 𝗶𝗻𝘁𝗲𝗿𝘃𝗶𝗲𝘄 𝘁𝗼 𝗹𝗲𝗮𝗿𝗻 𝗺𝗼𝗿𝗲: https://okt.to/wpcyLn

02/04/2026

𝗙𝗿𝗼𝗺 𝗪𝗮𝗳𝗲𝗿 𝘁𝗼 𝗜𝗻𝘀𝗶𝗴𝗵𝘁: 𝗛𝗶𝗴𝗵-𝗧𝗵𝗿𝗼𝘂𝗴𝗵𝗽𝘂𝘁 𝗘𝗹𝗹𝗶𝗽𝘀𝗼𝗺𝗲𝘁𝗿𝘆 𝘄𝗶𝘁𝗵 𝗘𝗣𝟰
With the 𝗘𝗣𝟰, you get more than just an ellipsometer — you get a microscope-augmented, high-throughput platform for mapping optical properties on real micro- and nano-structures. This is ideal for R&D and QC in semiconductors, 2D materials, photonics, MEMS, display coatings, biological interfaces, and more.

🔗 𝗗𝗶𝘀𝗰𝗼𝘃𝗲𝗿 𝗺𝗼𝗿𝗲: https://okt.to/d4SJKF

01/04/2026

Measuring 𝘁𝗵𝗶𝗻 𝗳𝗶𝗹𝗺𝘀 𝗼𝗻 𝗰𝘂𝗿𝘃𝗲𝗱 𝘀𝘂𝗿𝗳𝗮𝗰𝗲𝘀 comes with unique challenges, especially when accuracy and consistency matter.
In this webinar, we’ll take a closer look at how 𝗶𝗺𝗮𝗴𝗶𝗻𝗴 𝘀𝗽𝗲𝗰𝘁𝗿𝗼𝘀𝗰𝗼𝗽𝗶𝗰 𝗲𝗹𝗹𝗶𝗽𝘀𝗼𝗺𝗲𝘁𝗿𝘆 (ISE) can provide more precise and reliable analysis, even across complex geometries.
We’ll also share practical insights and real-world applications that can help improve your measurement approach.

If you’re working with thin films or advanced materials, this session could offer a valuable perspective.

👉 𝗥𝗲𝘀𝗲𝗿𝘃𝗲 𝘆𝗼𝘂𝗿 𝘀𝗽𝗼𝘁 𝘁𝗼𝗱𝗮𝘆: https://okt.to/pFbKWn

31/03/2026

𝟱 𝗰𝗶𝘁𝗶𝗲𝘀. 𝟱 𝗰𝗵𝗮𝗻𝗰𝗲𝘀 𝘁𝗼 𝗰𝗼𝗻𝗻𝗲𝗰𝘁. 𝟭 𝗴𝗹𝗼𝗯𝗮𝗹 𝗰𝗼𝗺𝗺𝘂𝗻𝗶𝘁𝘆 𝗽𝘂𝘀𝗵𝗶𝗻𝗴 𝗻𝗮𝗻𝗼𝘀𝗰𝗮𝗹𝗲 𝗶𝗻𝗻𝗼𝘃𝗮𝘁𝗶𝗼𝗻 𝗳𝗼𝗿𝘄𝗮𝗿𝗱.
Park Systems is proud to support NANOscientific Conferences 𝟮𝟬𝟮𝟲, a worldwide series created for scientists, engineers, and innovators across 𝗦𝗣𝗠 𝗮𝗻𝗱 𝗼𝗽𝘁𝗶𝗰𝗮𝗹 𝗺𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆. Each stop opens the door to new conversations, new collaborations, and new ways to explore advanced nanoscale instrumentation, from AFM to DHM and ISE.

📍 𝟮𝟬𝟮𝟲 𝗲𝘃𝗲𝗻𝘁𝘀
Sep 01-02, Park Systems HQ, Gwacheon, South Korea
Sep 09-11, Charles University, Prague, Czech Republic
Sep 22-23, Northeastern University, Boston, USA
Oct 14, University of Malaya, Kuala Lumpur, Malaysia
Oct 23, University of Tokyo, Tokyo, Japan

From research-focused sessions to academia-industry exchange, this series is built to inspire.

👉𝗘𝘅𝗽𝗹𝗼𝗿𝗲 𝘁𝗵𝗲 𝗲𝘃𝗲𝗻𝘁𝘀 𝗮𝗻𝗱 𝗿𝗲𝗴𝗶𝘀𝘁𝗲𝗿 𝘁𝗼 𝗯𝗲 𝗽𝗮𝗿𝘁 𝗼𝗳 𝗶𝘁: https://okt.to/Gnmrd6

30/03/2026

𝗦𝗘𝗠𝗜𝗖𝗢𝗡 𝗖𝗵𝗶𝗻𝗮 is where the semiconductor ecosystem comes together, and 𝗣𝗮𝗿𝗸 𝗦𝘆𝘀𝘁𝗲𝗺𝘀 𝘄𝗮𝘀 𝗽𝗿𝗼𝘂𝗱 𝘁𝗼 𝗯𝗲 𝗽𝗮𝗿𝘁 𝗼𝗳 𝗶𝘁 𝗹𝗮𝘀𝘁 𝘄𝗲𝗲𝗸 𝗶𝗻 𝗦𝗵𝗮𝗻𝗴𝗵𝗮𝗶!
China remains a vital force in the global semiconductor market, and this event is an outstanding opportunity to engage with leading chipmakers, investors, and strategic partners.

We were showcasing Park’s industrial metrology solutions for 𝘄𝗮𝗳𝗲𝗿 𝗽𝗿𝗼𝗰𝗲𝘀𝘀𝗶𝗻𝗴, 𝗽𝗵𝗼𝘁𝗼𝗺𝗮𝘀𝗸 𝗿𝗲𝗽𝗮𝗶𝗿, 𝗮𝗱𝘃𝗮𝗻𝗰𝗲𝗱 𝗽𝗮𝗰𝗸𝗮𝗴𝗶𝗻𝗴, 𝗳𝗹𝗮𝘁 𝗽𝗮𝗻𝗲𝗹 𝗱𝗶𝘀𝗽𝗹𝗮𝘆, 𝗮𝗻𝗱 𝗼𝗽𝘁𝗶𝗰𝗮𝗹 𝗽𝗿𝗼𝗳𝗶𝗹𝗼𝗺𝗲𝘁𝗿𝘆, alongside our 𝗻𝗲𝘄 𝗽𝗿𝗼𝗱𝘂𝗰𝘁 𝗹𝗶𝗻𝗲𝘂𝗽: NX-Interferom, NX-Wafer Plus, and NX-TSH300 Overlay.

We are excited to build on the insights from last week as we continue helping shape the future of semiconductors!

📡 𝗦𝘁𝗮𝘆 𝘁𝘂𝗻𝗲𝗱 𝗳𝗼𝗿 𝗺𝗼𝗿𝗲 𝘂𝗽𝗱𝗮𝘁𝗲𝘀 𝗳𝗿𝗼𝗺 𝗣𝗮𝗿𝗸 𝗦𝘆𝘀𝘁𝗲𝗺𝘀: https://okt.to/fymlbo

26/03/2026

𝗛𝗼𝘄 𝗱𝗼 𝘆𝗼𝘂 𝗺𝗼𝘃𝗲 𝗳𝗿𝗼𝗺 𝗶𝗺𝗮𝗴𝗶𝗻𝗴 𝗹𝗮𝘆𝗲𝗿𝗲𝗱 𝗺𝗮𝘁𝗲𝗿𝗶𝗮𝗹𝘀 𝘁𝗼 𝗮𝗰𝘁𝘂𝗮𝗹𝗹𝘆 𝘀𝗵𝗮𝗽𝗶𝗻𝗴 𝗮𝗻𝗱 𝘃𝗲𝗿𝗶𝗳𝘆𝗶𝗻𝗴 𝘁𝗵𝗲𝗺 𝘄𝗶𝘁𝗵 𝗰𝗼𝗻𝗳𝗶𝗱𝗲𝗻𝗰𝗲?
Join our webinar and see how automated AFM can support more controlled, systematic nanoscale experiments.

𝗞𝗲𝘆 𝘁𝗮𝗸𝗲𝗮𝘄𝗮𝘆𝘀:
• Graphene cutting by anodic oxidation
• Automated probe switching for high-resolution follow-up imaging
• Moiré pattern analysis in marginally twisted MoS2 bilayers
• Better control of twist angle, cleanliness, and lateral patterning

Register now to explore what AFM-enabled fabrication could unlock for your research.

🔗𝗥𝗲𝗴𝗶𝘀𝘁𝗿𝗮𝘁𝗶𝗼𝗻 𝗶𝗻𝗸: https://okt.to/yqBbFj

25/03/2026

A host of exotic physical phenomena arise in 𝘁𝘄𝗶𝘀𝘁𝗲𝗱 𝗯𝗶𝗹𝗮𝘆𝗲𝗿 𝗴𝗿𝗮𝗽𝗵𝗲𝗻𝗲 upon changing the angle between the top and bottom layer. Small changes in angle or strain can dramatically change the periodicity of the moiré pattern between the layers, which we can measure using 𝗔𝗙𝗠. In this example, 𝘁𝗼𝗿𝘀𝗶𝗼𝗻𝗮𝗹 𝗳𝗼𝗿𝗰𝗲 𝗺𝗶𝗰𝗿𝗼𝘀𝗰𝗼𝗽𝘆 (𝗧𝗙𝗠) amplitude imaging simultaneously resolves both a 𝗺𝗼𝗶𝗿é 𝘀𝘂𝗽𝗲𝗿𝗹𝗮𝘁𝘁𝗶𝗰𝗲 𝗯𝗲𝘁𝘄𝗲𝗲𝗻 ~𝟮.𝟮° 𝘁𝘄𝗶𝘀𝘁𝗲𝗱 𝗯𝗶𝗹𝗮𝘆𝗲𝗿 𝗴𝗿𝗮𝗽𝗵𝗲𝗻e with a periodicity o𝗳 ~𝟲.𝟯 𝗻𝗺 𝗮𝗻𝗱 𝘁𝗵𝗲 𝗮𝘁𝗼𝗺𝗶𝗰 𝗹𝗮𝘁𝘁𝗶𝗰𝗲 𝗼𝗳 𝘁𝗵𝗲 𝘁𝗼𝗽 𝗴𝗿𝗮𝗽𝗵𝗲𝗻𝗲. This type of nanoscale structural mapping is essential for linking layer registry and emergent properties such as correlated states, superconductivity, and tunable optoelectronic response for future 𝗾𝘂𝗮𝗻𝘁𝘂𝗺 𝗮𝗻𝗱 𝗹𝗼𝘄-𝗽𝗼𝘄𝗲𝗿 𝗱𝗲𝘃𝗶𝗰𝗲 𝗮𝗽𝗽𝗹𝗶𝗰𝗮𝘁𝗶𝗼𝗻𝘀.

💡Read more about how TFM enables moiré metrology: https://okt.to/YXWfcC

Sample courtesy: The Barcelona Institute of Science and Technology ICFO, Spain

24/03/2026

𝗠𝗲𝗲𝘁 𝗖𝗵𝗿𝗶𝘀𝘁𝗶𝗻𝗲 𝗖𝗼𝗿𝘀𝗶𝗻𝗼, 𝗼𝘂𝗿 𝘃𝗲𝗿𝘆 𝗼𝘄𝗻 𝗧𝗲𝗮𝗺 𝗔𝗻𝗴𝗲𝗹, 𝗮𝗻𝗱 𝘁𝗵𝗲 𝗔𝘀𝘀𝗶𝘀𝘁𝗮𝗻𝘁 𝘁𝗼 𝘁𝗵𝗲 𝗖𝗘𝗢 𝗮𝘁 𝗣𝗮𝗿𝗸 𝗦𝘆𝘀𝘁𝗲𝗺𝘀 𝗘𝘂𝗿𝗼𝗽𝗲, 𝗻𝗼𝘄 𝗶𝗻 𝘁𝗵𝗲 𝗧𝗲𝗮𝗺 𝗦𝗽𝗼𝘁𝗹𝗶𝗴𝗵𝘁 🎥🎬
“Although I work in a role that supports the whole organization, I feel deeply connected to the entire team. What inspires me most is the way people truly support one another. Thanks to the openness and guidance of our most experienced colleagues, knowledge is shared generously and no one is ever left behind.”

Christine is a central force behind communication and coordination across our European team. She supports her colleagues and the European General Manager in all kinds of business operations, bringing not only structure and reliability, but also warmth, kindness, and genuine care. Her positive and empathetic spirit makes her an indispensable part of the team and a person others can always rely on when things get complex.

Beyond the office, Christine is an active member of her Christian church community. She loves good music, time in nature, and most of all, her family. She is a devoted mother to her three wonderful daughters and takes great joy in supporting them on their journey through life.

𝗧𝗵𝗮𝗻𝗸 𝘆𝗼𝘂 𝗳𝗼𝗿 𝗯𝗲𝗶𝗻𝗴 𝗼𝘂𝗿 𝗮𝗻𝗴𝗲𝗹, 𝗖𝗵𝗿𝗶𝘀𝘁𝗶𝗻𝗲! ✨

Address

Suwon
16229

Website

https://www.parksystems.com/

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